Structural rearrangements during the initial growth stages of organic thin films of [F.sub.16]CuPc on Si[O.sub.2]
Article Abstract:
In situ X-ray reflectivity, in situ grazing incidences X-ray diffraction and ex situ atomic force microscopy are used to analyze the early stages of the thin film growth of the organic molecule [F.sub.16]CuPc (hexadecafluoro-copper-phthalocyanines) on Si[O.sub.2] and its morphology. The structural changes are observed that points to significant relaxations of the lattice parameters within the first layers of standing molecules.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2006
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Probing occupied states of the molecular layer in Au-alkanedithiol-GaAs diodes
Article Abstract:
Internal photoemission (IPE) studies were performed on molecular diodes in which the alkanedithiol [HS(CH2)(sub n)SH, n = 8,10] molecular layer is sandwiched between Au and GaAs electrodes. The molecular diodes show an exponential dependence in the IPE yield that does not come for Au or GaAs.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2005
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Deposition of ultrathin fluropolymer films on Si (100) and GaAs (100) surfaces by RF magnetron sputtering of poly(tetrafluroethylene-co-hexafluoropropylene)
Article Abstract:
Effects of sputtering gas plasma on chemical composition and structure of fluropolymer films were investigated. Peel-adhesion tests suggested that all sputter-deposited films adhered to the Si and GaAs substrates.
Publication Name: Journal of Physical Chemistry B
Subject: Chemicals, plastics and rubber industries
ISSN: 1520-6106
Year: 2003
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